From 07 to 09 September, the CEA List will participate in the 20th edition of the CIM in Lyon.
The International Congress of Metrology (CIM) The International Metrology Congress is a unique event in Europe, a showcase for industrial applications, advances in R&D and prospects dedicated to measurements, analysis and testing processes. It aims at optimising your measurements, analysis and testing processes, exploring the evolution of techniques and anticipating the advances in R&D. 200 presentations and 6 round tables sessions and an exhibition showcasing innovations and solutions are on the agenda.
Researchers from the CEA List Institute will present on September 8 their latest research in ionizing radiation « Contribution of X-ray tomography for primary references, related to ionizing radiation and its transfer ».
